DocumentCode :
1867338
Title :
I-V characteristic and reliability test of CPV modules
Author :
Liu, Haitao ; Sang, Shiyu ; Zou, Xinjing ; Zhai, Yonghui
Author_Institution :
Inst. of Electr. Eng., Beijing, China
fYear :
2011
fDate :
19-24 June 2011
Abstract :
To assess electrical and reliability performance of CPV modules of China, a test bed of CPV module I-V characteristics is established in the Institute of Electrical Engineering of Chinese Academy of Sciences in Beijing. The relative and absolute output power of CPV modules are measured using test methods of both IEC 62108 and ASTM E 2527. I-V characteristics under CPV Standard Test Condition (CSTC) are also compared and analyzed according to on-site I-V test result. This paper also discusses reliability test procedures, result and problems of IEC 62108. Major failures and causes of CPV modules and receivers during thermal cycling and humidity freeze tests are presented in this work. Encapsulating materials and Fresnel lens are key factors to successfully withstand reliability test.
Keywords :
lenses; reliability; solar cells; solar energy concentrators; testing; ASTM E 2527 test method; CPV modules; CPV standard test condition; CSTC; Fresnel lens; I-V characteristic; IEC 62108 test method; concentration photovoltaic module; encapsulating materials; reliability test; IEC standards; Power generation; Power measurement; Receivers; Reliability; Temperature measurement; Wind speed;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE
Conference_Location :
Seattle, WA
ISSN :
0160-8371
Print_ISBN :
978-1-4244-9966-3
Type :
conf
DOI :
10.1109/PVSC.2011.6186416
Filename :
6186416
Link To Document :
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