Title :
SLAC/CERN high gradient tests of an X-band accelerating section
Author :
Wang, J.W. ; Loew, G.A. ; Loewen, R.J. ; Ruth, R.D. ; Vlieks, A.E. ; Wilson, I. ; Wuensch, W.
Author_Institution :
Stanford Linear Accel. Center, Stanford Univ., CA, USA
Abstract :
High frequency linear collider schemes envisage the use of rather high accelerating gradients: 50 to 100 MV/m for X-band and 80 MV/m for CLIC. Because these gradients are well above those commonly used in accelerators, high gradient studies of high frequency structures have been initiated and test facilities have been constructed at KEK, SLAC and CERN. The studies seek to demonstrate that the above mentioned gradients are both achievable and practical. There is no well-defined criterion for the maximum acceptable level of dark current but it must be low enough not to generate unacceptable transverse wakefields, disturb beam position monitor readings or cause RF power losses. Because there are of the order of 10,000 accelerating sections in a high frequency linear collider, the conditioning process should not be too long or difficult. The test facilities have been instrumented to allow investigation of field emission and RF breakdown mechanisms. With an understanding of these effects, the high gradient performance of accelerating sections may be improved through modifications in geometry, fabrication methods and surface finish. These high gradient test facilities also allow the ultimate performance of high frequency/short pulse length accelerating structures to be probed. This report describes the high gradient test at SLAC of an X-band accelerating section built at CERN using technology developed for CLIC
Keywords :
accelerator RF systems; colliding beam accelerators; electron accelerators; electron field emission; linear colliders; CERN high gradient tests; CLIC; KEK; RF breakdown; SLAC high gradient tests; X-band accelerating section; conditioning process; dark current; fabrication methods; field emission; high frequency linear collider schemes; high frequency structures; short pulse length; surface finish; test facilities; Acceleration; Dark current; Electric breakdown; Geometry; Instruments; Life estimation; Power generation; Radio frequency; Test facilities; Testing;
Conference_Titel :
Particle Accelerator Conference, 1995., Proceedings of the 1995
Conference_Location :
Dallas, TX
Print_ISBN :
0-7803-2934-1
DOI :
10.1109/PAC.1995.504746