• DocumentCode
    1868382
  • Title

    High efficiency Cu2ZnSn(SxSe1−x)4 thin film solar cells by thermal co-evaporation

  • Author

    Shin, Byungha ; Wang, Kejia ; Gunawan, Oki ; Reuter, Kathleen B. ; Chey, S. Jay ; Bojarczuk, Nestor A. ; Todorov, Teodor ; Mitzi, David B. ; Guha, Supratik

  • Author_Institution
    IBM T.J. Watson Res. Center, Yorktown Heights, NY, USA
  • fYear
    2011
  • fDate
    19-24 June 2011
  • Abstract
    We report on the device results of thermally evaporated high efficiency Cu2ZnSn(SxSe1-x)4 (CZTSSe) thin film solar cells with power conversion efficiencies of 7.1% (x=1.0) and 7.5% (x=0.34). We have carried out extensive electrical and structural characterization of CZTSSe solar cells to identify major factors that limit the efficiency. Bias-dependent quantum efficiency measurements revealed ineffective collection of charge carriers photo-generated deep in the absorber layer suggesting a short minority carrier diffusion length, which was confirmed by time-resolved photoluminescence measurements. Temperature-dependence of the series resistance of the devices is consistent with the presence of a Schottky-type barrier in the back contact, likely caused by secondary phases near the CZTS/Mo interface and/or an interfacial MoSx layer.
  • Keywords
    Schottky barriers; carrier lifetime; copper compounds; molybdenum compounds; photoluminescence; semiconductor thin films; solar cells; tin compounds; vacuum deposition; zinc compounds; Cu2ZnSn(SSe)4; MoS; Schottky type barrier; absorber; back contact; bias dependent quantum efficiency measurements; charge carriers photogeneration; minority carrier diffusion length; power conversion efficiency; thermal co-evaporation; thin film solar cells; time-resolved photoluminescence measurements; Electric variables measurement; Films; Photonic band gap; Photovoltaic cells; Scanning electron microscopy; Temperature measurement; Wavelength measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE
  • Conference_Location
    Seattle, WA
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-9966-3
  • Type

    conf

  • DOI
    10.1109/PVSC.2011.6186456
  • Filename
    6186456