• DocumentCode
    1868443
  • Title

    Na distribution in CIGS solar cells grown with modified three-stage processes

  • Author

    Seyrling, S. ; Chirila, A. ; Güttler, D. ; Blösch, P. ; Pianezzi, F. ; Bücheler, S. ; Uhl, A.R. ; Rossbach, P. ; Müller, U. ; Tiwari, A.N.

  • Author_Institution
    Lab. for Thin Films & Photovoltaics, Fed. Labs. for Mater. Sci. & Technol., Dübendorf, Switzerland
  • fYear
    2011
  • fDate
    19-24 June 2011
  • Abstract
    Highest efficiency CIGS solar cells are generally grown with a three-stage co-evaporation process where the absorber layer is in a copper-rich regime for a period of time at the end of the second stage. We investigated the influence of changing the maximum [Cu]/[In+Ga] ratio at the end of stage 2 on the distribution of sodium throughout the absorber layer when sodium is supplied by diffusion from the soda-lime glass substrate. Secondary ion mass spectrometry (SIMS) was used for depth profiling of the Na content, the surface concentration of Na was determined by wavelength dispersive X-ray analysis (WDX) from top view scanning electron micrographs. Raman investigation of the phase composition of the surface and SIMS compositional depth profiles of the investigated absorber layers suggested the possibility of the formation of a Na-rich compound on the absorber layer surface for CIGS grown with low Cu excess while absorbers grown with high excess showed a more evenly distributed Na depth profile. New WDX results further support these claims as a surface [Na]/[Cu+Na] ratio of up to 0.2 for layers grown with low Cu excess was measured while the Na surface values of absorbers grown with high Cu excess are below the detection limit.
  • Keywords
    Raman spectra; X-ray chemical analysis; calcium compounds; chemical interdiffusion; copper compounds; evaporation; gallium compounds; glass; indium compounds; scanning electron microscopy; secondary ion mass spectra; silicon compounds; sodium compounds; solar cells; CIGS solar cells; CuInGaSe2; Na distribution; Na2O-CaO-SiO2; Raman investigation; absorber layer; copper-rich regime; diffusion; scanning electron micrographs; secondary ion mass spectrometry; soda-lime glass substrate; surface concentration; three-stage co-evaporation; wavelength dispersive X-ray analysis; Copper; Photovoltaic cells; Photovoltaic systems; Substrates; Surface treatment; Surface waves;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE
  • Conference_Location
    Seattle, WA
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-9966-3
  • Type

    conf

  • DOI
    10.1109/PVSC.2011.6186458
  • Filename
    6186458