DocumentCode :
1868467
Title :
Selective metal parallel shunting inductor and its VCO application
Author :
Chia-Hsin Wu ; Chun-Yi Kuo ; Shen-Iuan Liu
Author_Institution :
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
fYear :
2003
fDate :
12-14 June 2003
Firstpage :
37
Lastpage :
40
Abstract :
For a planar inductor, the maximal quality factor, Q/sub max/, is located at the specified frequency, f/sub Qmax/. In this paper, a method called selective metal parallel shunting (SMPS) is proposed to move f/sub Qmax/ onto the desired frequency without additional processing steps. For a given planar inductor, a customized program is developed to find all the possible SMPS inductors and predict their Q/sub max/ and f/sub max/. Three sets of planar, all metal parallel shunting (AMPS), and SMPS inductors have been implemented in a 1P4M 0.35 /spl mu/m CMOS process to verify the proposed method. The prediction errors of Q/sub max/ and f/sub Qmax/ are less than 13% and 10%, respectively, between the simulated and measured ones. Moreover, three 2.3-2.4 GHz VCOs using planar, AMPS, and SMPS inductors, respectively, have also been realized. The phase noise of the VCO using SMPS inductors can be improved by 9.3 dB and 6 dB, respectively, compared to the VCOs using planar and AMPS inductors at 100 KHz offset frequency. The figure-of-merit (FOM) performance of the VCO using SMPS inductors can be comparable to the state-of-the-art publications.
Keywords :
CMOS integrated circuits; Q-factor; UHF devices; inductors; phase noise; switched mode power supplies; voltage-controlled oscillators; 0.35 micron; 100 kHz; 2.3 to 2.4 GHz; 6 dB; 9.3 dB; CMOS process; SMPS inductors; VCO; figure of merit; phase noise; planar inductor; quality factor; selective metal parallel shunting; selective metal parallel shunting inductor; Frequency; Inductors; Phase noise; Planar transmission lines; Power transmission lines; Propagation losses; Q factor; Switched-mode power supply; Voltage; Voltage-controlled oscillators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Circuits, 2003. Digest of Technical Papers. 2003 Symposium on
Conference_Location :
Kyoto, Japan
Print_ISBN :
4-89114-034-8
Type :
conf
DOI :
10.1109/VLSIC.2003.1221155
Filename :
1221155
Link To Document :
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