• DocumentCode
    1868568
  • Title

    Optimal bandgap combinations — Does material quality matter?

  • Author

    Chan, Ngai L A ; Ekins-Daukes, Ned J. ; Brindley, Helen E.

  • Author_Institution
    Dept. of Phys., Imperial Coll. London, London, UK
  • fYear
    2011
  • fDate
    19-24 June 2011
  • Abstract
    Summary form only given. The balance of photogeneration and recombination gives rise to an optimum band-gap for any solar cell. The radiative limit represents the lowest permissible level of recombination in a solar cell and therefore places an upper limit on the voltage that can be attained. Introducing additional, non-radiative recombination results in a loss in voltage that can only be compensated for by moving to higher band-gaps. Consequently the optimal band-gap for solar energy conversion will rise with increasing non-radiative recombination rate. This balance was recognized by Shockley and Queisser for single junction solar cells and is here extended to multi-junction solar cells. A rise in optimal band-gaps has been observed in simulated single, double and triple junction devices as non-radiative recombination increases. Optimal band gaps between excellent poor diode `quality´ devices are shown to differ by 100s of meV under 1-Sun AM0 illumination, but exhibit no significant change under a 500-Sun AM1.5D spectrum.
  • Keywords
    photovoltaic power systems; solar cells; 1-Sun AM0 illumination; 500-Sun AM1.5D spectrum; diode quality device; higher band-gaps; lowest permissible level; material quality matter; multijunction solar cell; nonradiative recombination rate; optimal bandgap combination; photogeneration balance; radiative limit; simulated double junction device; simulated single junction device; simulated triple junction device; single junction solar cell; solar energy conversion; IEEE Xplore; Junctions; Materials; Photonic band gap; Photovoltaic cells; Physics; Solar power generation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE
  • Conference_Location
    Seattle, WA
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-9966-3
  • Type

    conf

  • DOI
    10.1109/PVSC.2011.6186463
  • Filename
    6186463