Title :
Application of n-type microcrystalline hydrogenated silicon oxide film to hetero-junction microcrystalline silicon solar cells
Author :
Fujioka, Hideaki ; Krajangsang, Taweewat ; Sichanugrist, Porponth ; Konagai, Makoto
Author_Institution :
Dept. of Phys. Electron., Tokyo Inst. of Technol., Tokyo, Japan
Abstract :
In this study, the effect of wide-gap n-type μc-Si1-XOX:H film on the performance of hetero-junction μc-Si:H solar cells has been investigated. We have developed n-μc-Si1-XOX:H films by RF-PECVD (13.56 MHz) using a gas mixture of silane (SiH4), hydrogen (H2), 1%-hydrogen-diluted phosphine (PH3) and carbon dioxide (CO2) at a low substrate temperature of about 200°C. It was found that optical band gap (E04) of n-type μc-Si1-XOX:H films were increased to larger than 2.4eV with increasing CO2/SiH4 ratio and power density. Under the optimized condition, a film showed the E04 of 2.38 eV, dark conductivity (σd) of 0.086 S/cm, activation energy of 0.076 eV and crystal volume fraction (XC) of 37%. The effect of n-μc-Si1-XOX:H was confirmed by J-V characteristics and spectral response of the hetero-junction μc-Si:H solar cells. The short-circuit current (JSC) was increased from 23.1 mA/cm2 to 23.7 mA/cm2 and the spectral response in the long wavelength region was increased. Even if this observation needs further confirmation, our study demonstrated that wide-gap n-type μc-Si1-XOX:H films is beneficial for improving the performance of hetero-junction μc-Si:H solar cells.
Keywords :
energy gap; plasma CVD; short-circuit currents; silicon compounds; solar cells; thin films; J-V characteristics; RF-PECVD; Si:H; Si1-XOX:H; activation energy; carbon dioxide; crystal volume fraction; dark conductivity; heterojunction microcrystalline silicon solar cells; hydrogen-diluted phosphine; n-type microcrystalline hydrogenated silicon oxide film; optical band gap; short-circuit current; silane; Absorption; Conductivity; Optical films; Photonic band gap; Photovoltaic cells; Plasmas;
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE
Conference_Location :
Seattle, WA
Print_ISBN :
978-1-4244-9966-3
DOI :
10.1109/PVSC.2011.6186472