DocumentCode :
1868912
Title :
Controlled fabrication of nanoscale gaps using stiction
Author :
Niroui, Farnaz ; Sletten, Ellen M. ; Deotare, Parag B. ; Wang, Annie I. ; Swager, Timothy M. ; Lang, Jeffrey H. ; Bulovic, Vladimir
Author_Institution :
Massachusetts Inst. of Technol., Cambridge, MA, USA
fYear :
2015
fDate :
18-22 Jan. 2015
Firstpage :
85
Lastpage :
88
Abstract :
Utilizing stiction, a common failure mode in micro/nano electromechanical systems (M/NEMS), we propose a method for the controlled fabrication of nanometer-thin gaps between electrodes. In this approach, a single lithography step is used to pattern cantilevers that undergo lateral motion towards opposing stationary electrodes separated by a defined gap. Upon wet developing of the pattern, capillary forces induce cantilever deflection and collapse leading to permanent adhesion between the tip and an opposing support structure. The deflection consequently reduces the separation gap between the cantilever and the electrodes neighboring the point of stiction to dimensions smaller than originally patterned. Through nanoscale force control achieved by altering device design, we demonstrate the fabrication of nanogaps having controlled widths smaller than 15 nm. We further discuss optimization of these nanoscale gaps for applications in NEM and molecular devices.
Keywords :
cantilevers; failure analysis; lithography; microelectrodes; microfabrication; micromechanical devices; nanofabrication; stiction; M/NEMS; cantilever deflection; capillary forces; common failure mode; device design; lateral motion; micro/nano electromechanical systems; molecular devices; nanometer-thin gaps; nanoscale force control; nanoscale gaps controlled fabrication; permanent adhesion; single lithography step; stationary electrodes; stiction; Adhesives; Electrodes; Gold; Nanoscale devices; Self-assembly; Surface treatment;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Micro Electro Mechanical Systems (MEMS), 2015 28th IEEE International Conference on
Conference_Location :
Estoril
Type :
conf
DOI :
10.1109/MEMSYS.2015.7050892
Filename :
7050892
Link To Document :
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