Title :
Optical assessment of selectively oxidised Al(Ga)As/GaAs multilayers
Author :
Donchev, V. ; Mazilu, M. ; Miller, A. ; Blum, O.
Author_Institution :
Sch. of Phys. & Astron., St. Andrews Univ., UK
Abstract :
Summary form only given. We study a series of selectively oxidised AlGaAs-GaAs multilayers using a new reflectivity technique, which has the advantages of real time spectral corrections and noise reduction. We have also developed a new approach (the LQR method) for calculating the reflectivity and transmission spectra of a multilayered structure with N interfaces.
Keywords :
III-V semiconductors; aluminium compounds; gallium arsenide; interface roughness; optical multilayers; reflectivity; refractive index; Al(Ga)As/GaAs multilayers; AlGaAs-GaAs; AlGaAs-GaAs multilayers; LQR method; interfaces; multilayered structure; noise reduction; optical assessment; real time spectral corrections; reflectivity spectra; reflectivity technique; selectively oxidised; transmission spectra; Gallium arsenide; Nonhomogeneous media; Optical beams; Optical films; Optical refraction; Optical variables control; Optical waveguides; Reflectivity; Refractive index; Stimulated emission;
Conference_Titel :
Lasers and Electro-Optics, 1999. CLEO '99. Summaries of Papers Presented at the Conference on
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
1-55752-595-1
DOI :
10.1109/CLEO.1999.834199
