DocumentCode
1868954
Title
Optical assessment of selectively oxidised Al(Ga)As/GaAs multilayers
Author
Donchev, V. ; Mazilu, M. ; Miller, A. ; Blum, O.
Author_Institution
Sch. of Phys. & Astron., St. Andrews Univ., UK
fYear
1999
fDate
28-28 May 1999
Firstpage
286
Abstract
Summary form only given. We study a series of selectively oxidised AlGaAs-GaAs multilayers using a new reflectivity technique, which has the advantages of real time spectral corrections and noise reduction. We have also developed a new approach (the LQR method) for calculating the reflectivity and transmission spectra of a multilayered structure with N interfaces.
Keywords
III-V semiconductors; aluminium compounds; gallium arsenide; interface roughness; optical multilayers; reflectivity; refractive index; Al(Ga)As/GaAs multilayers; AlGaAs-GaAs; AlGaAs-GaAs multilayers; LQR method; interfaces; multilayered structure; noise reduction; optical assessment; real time spectral corrections; reflectivity spectra; reflectivity technique; selectively oxidised; transmission spectra; Gallium arsenide; Nonhomogeneous media; Optical beams; Optical films; Optical refraction; Optical variables control; Optical waveguides; Reflectivity; Refractive index; Stimulated emission;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics, 1999. CLEO '99. Summaries of Papers Presented at the Conference on
Conference_Location
Baltimore, MD, USA
Print_ISBN
1-55752-595-1
Type
conf
DOI
10.1109/CLEO.1999.834199
Filename
834199
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