Title :
Measurement imperfections impact on the performance of digitally predistorted power amplifiers
Author :
Tingxiao Yang ; Zenteno, Efrain ; Bjorsell, Niclas
Author_Institution :
ATM/Electron., Univ. of Gavle, Gavle, Sweden
Abstract :
This paper presents an study of the impact of analog to digital converter (ADC) impairments on digital pre-distortion (DPD) techniques when applied to RF power amplifiers (PA). The DPD technique is described by a memory polynomial model while the ADC impairments are modeled by quantization noise, random jitter, and the integral nonlinearity (INL); thus, summarizing systematic and random nature of ADC imperfect measurements. It is observed that increased jitter will have a negative impact on the modeling but not so much on the output performance from the pre-distorted PA. Moreover, the ENOB can be used as metric for both the quantization noise and integral nonlinearity and there is a value of ENOB which, if exceeded, do not improve the DPD performance; in this paper it is about 8 bits.
Keywords :
jitter; polynomials; quantisation (signal); radiofrequency power amplifiers; ADC; DPD technique; INL; RF power amplifiers; analog to digital converter; digitally predistorted power amplifiers; integral nonlinearity; measurement imperfections impact; memory polynomial model; quantization noise; random jitter; Distortion measurement; Jitter; Noise; Nonlinear distortion; Power amplifiers; Quantization (signal); Signal resolution; Digital pre-distortion (DPD); Integral non-linearity (INL); Power amplifiers; jitter; quantization noise;
Conference_Titel :
Instrumentation and Measurement Technology Conference (I2MTC) Proceedings, 2014 IEEE International
Conference_Location :
Montevideo
DOI :
10.1109/I2MTC.2014.6860742