• DocumentCode
    1869345
  • Title

    Suprathermal electron diagnostics, based on X-ray line radiation polarization measurements

  • Author

    Baronova, E.O.

  • Author_Institution
    Kurchatov (I.V.) Inst. of Atomic Energy, Moscow, Russia
  • fYear
    1997
  • fDate
    19-22 May 1997
  • Firstpage
    205
  • Abstract
    Summary form only given. Suprathermal electrons play an important role in energy transfer and in the formation of emission spectra in a plasma. An electron beam energy estimation on the basis of polarization measurements of X-ray lines is presented in this paper. Experiments were carried out on the PF Mather type facility. The investigation of spectra of He-like Ar in the range of 3.5-5 /spl Aring/ was made by two focusing crystal spectrographs, oriented perpendicular; one with respect to another and to discharge axis. Such an arrangement makes it possible to measure the dependence of relative intensities of X-ray lines on crystal orientation.
  • Keywords
    X-ray emission spectra; X-ray spectra; plasma diagnostics; plasma focus; 3.5 to 5 A; Ar; Ar/sup 16+/; He-like Ar; X-ray line radiation polarization measurements; X-ray lines; crystal orientation; electron beam energy estimation; emission spectra; focusing crystal spectrographs; plasma; plasma focus Mather type facility; polarization measurements; suprathermal electron diagnostics; Anodes; Argon; Electromagnetic scattering; Electron beams; Ionization; Light scattering; Plasma density; Plasma measurements; Plasma waves; Polarization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Science, 1997. IEEE Conference Record - Abstracts., 1997 IEEE International Conference on
  • Conference_Location
    San Diego, CA, USA
  • ISSN
    0730-9244
  • Print_ISBN
    0-7803-3990-8
  • Type

    conf

  • DOI
    10.1109/PLASMA.1997.604870
  • Filename
    604870