DocumentCode :
1869345
Title :
Suprathermal electron diagnostics, based on X-ray line radiation polarization measurements
Author :
Baronova, E.O.
Author_Institution :
Kurchatov (I.V.) Inst. of Atomic Energy, Moscow, Russia
fYear :
1997
fDate :
19-22 May 1997
Firstpage :
205
Abstract :
Summary form only given. Suprathermal electrons play an important role in energy transfer and in the formation of emission spectra in a plasma. An electron beam energy estimation on the basis of polarization measurements of X-ray lines is presented in this paper. Experiments were carried out on the PF Mather type facility. The investigation of spectra of He-like Ar in the range of 3.5-5 /spl Aring/ was made by two focusing crystal spectrographs, oriented perpendicular; one with respect to another and to discharge axis. Such an arrangement makes it possible to measure the dependence of relative intensities of X-ray lines on crystal orientation.
Keywords :
X-ray emission spectra; X-ray spectra; plasma diagnostics; plasma focus; 3.5 to 5 A; Ar; Ar/sup 16+/; He-like Ar; X-ray line radiation polarization measurements; X-ray lines; crystal orientation; electron beam energy estimation; emission spectra; focusing crystal spectrographs; plasma; plasma focus Mather type facility; polarization measurements; suprathermal electron diagnostics; Anodes; Argon; Electromagnetic scattering; Electron beams; Ionization; Light scattering; Plasma density; Plasma measurements; Plasma waves; Polarization;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Plasma Science, 1997. IEEE Conference Record - Abstracts., 1997 IEEE International Conference on
Conference_Location :
San Diego, CA, USA
ISSN :
0730-9244
Print_ISBN :
0-7803-3990-8
Type :
conf
DOI :
10.1109/PLASMA.1997.604870
Filename :
604870
Link To Document :
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