Title :
Reaction force inspection system using wavelet transforms and neural networks
Author :
Yamada, Yasuhiro ; Komura, Yoshiaki ; Masuda, Masanobu ; Ookubo, Yuuichi
Author_Institution :
Fukui Univ., Japan
Abstract :
Looks at a system for inspection of the quality of a probe´s reaction force characteristics. This system, until now considered difficult to realize, automates the inspection method utilizing the touching of an inspector´s finger. Wavelet transformation and a neural network (NN) approach are applied to the system for probes to learn an inspector´s finger judgment. We provide an input layer of a NN with thirty-three nodes corresponding to a time series of reaction forces of a probe and an output layer with one node corresponding to a judgment; being one of non-defective, defective, or unable to judge. From experimental results, the effectiveness of the system has been clarified
Keywords :
force measurement; inspection; neural nets; probes; time series; wavelet transforms; finger judgment; neural networks; probe reaction force characteristics; reaction force inspection system; time series; wavelet transforms; Costs; Fingers; Force measurement; Force sensors; Inspection; Motion measurement; Neural networks; Probes; Springs; Wavelet transforms;
Conference_Titel :
Robotics and Automation, 2002. Proceedings. ICRA '02. IEEE International Conference on
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-7272-7
DOI :
10.1109/ROBOT.2002.1013617