• DocumentCode
    186961
  • Title

    Sub-pixel straight lines detection for measuring through machine vision

  • Author

    Flesia, Ana Georgina ; Ames, G. ; Bergues, G. ; Canali, L. ; Schurrer, C.

  • Author_Institution
    Famaf-UNC, CIEM-Conicet-Cordoba, Cordoba, Spain
  • fYear
    2014
  • fDate
    12-15 May 2014
  • Firstpage
    402
  • Lastpage
    406
  • Abstract
    External visual interfaces for high precision measuring devices are based on the segmentation of images of their measuring reticle. In this paper, a method for subpixel straight lines detection is presented and tested on images taken from the reticle of a dark field autocollimator. The method has three steps, the sharpening of the image using a version of the Savitzky-Golay filter for smoothing and differentiation, the construction of a coarse edge image using Sobel filters, and finally, the subpixel edge location determination, by fitting a Gaussian function to orthogonal sections of the coarse edge image.We discuss results of applying the proposed method to images of the reticle of a Nikon 6D autocollimator, using the scale of the device as a benchmark for testing the error in the location of the lines and compare them with Sobel/Hough and Sobel/polynomial fitting. We report that for this type of image-content, Gaussian fitting has smaller uncertainty, when cameras with two different sensors are used.
  • Keywords
    CCD image sensors; Gaussian processes; computer vision; edge detection; filtering theory; image segmentation; object detection; polynomials; user interfaces; Gaussian fitting; Gaussian function; Nikon 6D autocollimator; Savitzky-Golay filter; Sobel filters; Sobel/Hough fitting; Sobel/polynomial fitting; coarse edge image; dark field autocollimator; image segmentation; machine vision; measuring reticle; orthogonal section; precision measuring device; sensors; subpixel edge location determination; subpixel straight lines detection; visual interfaces; Accuracy; CMOS integrated circuits; Detectors; Image edge detection; Polynomials; Transforms;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference (I2MTC) Proceedings, 2014 IEEE International
  • Conference_Location
    Montevideo
  • Type

    conf

  • DOI
    10.1109/I2MTC.2014.6860776
  • Filename
    6860776