DocumentCode :
186961
Title :
Sub-pixel straight lines detection for measuring through machine vision
Author :
Flesia, Ana Georgina ; Ames, G. ; Bergues, G. ; Canali, L. ; Schurrer, C.
Author_Institution :
Famaf-UNC, CIEM-Conicet-Cordoba, Cordoba, Spain
fYear :
2014
fDate :
12-15 May 2014
Firstpage :
402
Lastpage :
406
Abstract :
External visual interfaces for high precision measuring devices are based on the segmentation of images of their measuring reticle. In this paper, a method for subpixel straight lines detection is presented and tested on images taken from the reticle of a dark field autocollimator. The method has three steps, the sharpening of the image using a version of the Savitzky-Golay filter for smoothing and differentiation, the construction of a coarse edge image using Sobel filters, and finally, the subpixel edge location determination, by fitting a Gaussian function to orthogonal sections of the coarse edge image.We discuss results of applying the proposed method to images of the reticle of a Nikon 6D autocollimator, using the scale of the device as a benchmark for testing the error in the location of the lines and compare them with Sobel/Hough and Sobel/polynomial fitting. We report that for this type of image-content, Gaussian fitting has smaller uncertainty, when cameras with two different sensors are used.
Keywords :
CCD image sensors; Gaussian processes; computer vision; edge detection; filtering theory; image segmentation; object detection; polynomials; user interfaces; Gaussian fitting; Gaussian function; Nikon 6D autocollimator; Savitzky-Golay filter; Sobel filters; Sobel/Hough fitting; Sobel/polynomial fitting; coarse edge image; dark field autocollimator; image segmentation; machine vision; measuring reticle; orthogonal section; precision measuring device; sensors; subpixel edge location determination; subpixel straight lines detection; visual interfaces; Accuracy; CMOS integrated circuits; Detectors; Image edge detection; Polynomials; Transforms;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference (I2MTC) Proceedings, 2014 IEEE International
Conference_Location :
Montevideo
Type :
conf
DOI :
10.1109/I2MTC.2014.6860776
Filename :
6860776
Link To Document :
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