• DocumentCode
    186969
  • Title

    Spectral-spatial hyperspectral image classification via SVM and superpixel segmentation

  • Author

    Zhi He ; Yue Shen ; Miao Zhang ; Qiang Wang ; Yan Wang ; Renlong Yu

  • Author_Institution
    Dept. of Control Sci. & Eng., Harbin Inst. of Technol., Harbin, China
  • fYear
    2014
  • fDate
    12-15 May 2014
  • Firstpage
    422
  • Lastpage
    427
  • Abstract
    Integration of spatial information has recently emerged as a powerful tool in improving the classification accuracy of hyperspectral image (HSI). However, partitioning homogeneous regions of the HSI remains a challenging task. This paper proposes a novel spectral-spatial classification method inspired by the support vector machine (SVM) and superpixel segmentation. Core ideas of the proposed method are twofold: 1) the HSI is first classified by the pixel-wise classifier (i.e. SVM); 2) a fast superpixel segmentation-based spatial processing is, for the first time, introduced in this study to refine the homogeneity and consistency of the classification maps. Experiments are conducted on two benchmark HSIs (i.e. the Indian Pines data and the Washington, D.C. Mall data) with different spectral and spatial resolutions. It is found that the proposed method yields more accurate classification results compared to the state-of-the-art techniques.
  • Keywords
    geophysical image processing; hyperspectral imaging; image classification; image segmentation; remote sensing; support vector machines; Indian Pines data; SVM; Washington DC data; classification accuracy; classification maps; pixel-wise classifier; spatial information; spatial processing; spectral-spatial hyperspectral image classification; superpixel segmentation; support vector machine; Image color analysis; Image resolution; Image segmentation; Support vector machines; classification; entropy; graph; hyperspectral image (HSI); superpixel segmentation; support vector machine (SVM);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference (I2MTC) Proceedings, 2014 IEEE International
  • Conference_Location
    Montevideo
  • Type

    conf

  • DOI
    10.1109/I2MTC.2014.6860780
  • Filename
    6860780