DocumentCode
1869763
Title
Role of doping profile on semiconductor laser performance: simulation and experiment
Author
Hybertsen, Mark S. ; Alam, Md. Ashraful ; Baraff, G.A. ; Smith, R.K. ; Belenky, G.L. ; Donetsky, D.V. ; Shtengel, G.E. ; Reynolds, C.L. ; Kazarinov, R.F.
Author_Institution
Bell Labs., Lucent Technol., Murray Hill, NJ, USA
fYear
1999
fDate
28-28 May 1999
Firstpage
309
Lastpage
310
Abstract
Summary form only given. It is widely known that the doping near the active region of a semiconductor laser has important consequences for the device performance, e.g. leakage current and modulation response. However, a clear microscopic picture is still needed. In this paper, we show that p-i junction placement controls laser output characteristics, in agreement with predictions of microscopic simulation. However, the same doping profile can not simultaneously optimize the static output characteristics and the high speed modulation response.
Keywords
doping profiles; leakage currents; optical modulation; quantum well lasers; semiconductor device models; MQW laser; active region; doping profile role; high speed modulation response; laser output characteristics; leakage current; microscopic simulation; normal carrier transport; p-i junction placement; resonance frequency; semiconductor laser performance; slope efficiency; static output characteristics; Delay; Doping profiles; Fluctuations; Laser feedback; Laser mode locking; Laser modes; Optical bistability; Optical feedback; Optical pulses; Semiconductor lasers;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics, 1999. CLEO '99. Summaries of Papers Presented at the Conference on
Conference_Location
Baltimore, MD, USA
Print_ISBN
1-55752-595-1
Type
conf
DOI
10.1109/CLEO.1999.834234
Filename
834234
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