• DocumentCode
    1869763
  • Title

    Role of doping profile on semiconductor laser performance: simulation and experiment

  • Author

    Hybertsen, Mark S. ; Alam, Md. Ashraful ; Baraff, G.A. ; Smith, R.K. ; Belenky, G.L. ; Donetsky, D.V. ; Shtengel, G.E. ; Reynolds, C.L. ; Kazarinov, R.F.

  • Author_Institution
    Bell Labs., Lucent Technol., Murray Hill, NJ, USA
  • fYear
    1999
  • fDate
    28-28 May 1999
  • Firstpage
    309
  • Lastpage
    310
  • Abstract
    Summary form only given. It is widely known that the doping near the active region of a semiconductor laser has important consequences for the device performance, e.g. leakage current and modulation response. However, a clear microscopic picture is still needed. In this paper, we show that p-i junction placement controls laser output characteristics, in agreement with predictions of microscopic simulation. However, the same doping profile can not simultaneously optimize the static output characteristics and the high speed modulation response.
  • Keywords
    doping profiles; leakage currents; optical modulation; quantum well lasers; semiconductor device models; MQW laser; active region; doping profile role; high speed modulation response; laser output characteristics; leakage current; microscopic simulation; normal carrier transport; p-i junction placement; resonance frequency; semiconductor laser performance; slope efficiency; static output characteristics; Delay; Doping profiles; Fluctuations; Laser feedback; Laser mode locking; Laser modes; Optical bistability; Optical feedback; Optical pulses; Semiconductor lasers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics, 1999. CLEO '99. Summaries of Papers Presented at the Conference on
  • Conference_Location
    Baltimore, MD, USA
  • Print_ISBN
    1-55752-595-1
  • Type

    conf

  • DOI
    10.1109/CLEO.1999.834234
  • Filename
    834234