DocumentCode :
1869831
Title :
Methods for determining a maximum operating frequency for TTL gates
Author :
Lewis, Randall D. ; Awkward, Kenneth W.
Author_Institution :
Westinghouse Electr. Corp., Baltimore, MD, USA
fYear :
1990
fDate :
23-25 Jan 1990
Firstpage :
372
Lastpage :
377
Abstract :
Two methods for determining a realistic maximum operating frequency for TTL gates are developed. Both methods involve using propagation delay times and redefining them to valid TTL levels. The first method is a rigorous treatment of the subject, while the second is an easy-to-use rule of thumb. The exponential-linear method, which is extensively discussed, is slightly conservative. No devices tested during this study would have failed due to the maximum operating frequency (fMAX) computed using this technique. The linear-linear technique is less conservative; several devices in this study would have failed to meet fMAX requirements had this technique been used
Keywords :
failure analysis; logic circuits; reliability; transistor-transistor logic; TTL gates; exponential-linear method; failure analysis; linear-linear technique; logic gates; maximum operating frequency; propagation delay times; reliability; Circuit testing; Frequency; Integrated circuit testing; Laboratories; Logic devices; Maintenance; Manufacturing; Propagation delay; Temperature; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium, 1990. Proceedings., Annual
Conference_Location :
Los Angeles, CA
Type :
conf
DOI :
10.1109/ARMS.1990.67986
Filename :
67986
Link To Document :
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