Title :
A broad-band power spectrum analyzer based on twin-channel delayed sampling
Author :
Mirri, Domenico ; Iuculano, G. ; Pasini, Gaetano ; Filicor, Fabio ; Peretto, Lorenzo
Author_Institution :
Dipt. di Ingegneria Elettrica, Bologna Univ., Italy
Abstract :
This paper describes a power spectrum analyzer whose bandwidth is not limited by the mean sampling time. The procedure is based on the estimation of the spectral components of the autocorrelation function of the input signal through the simultaneous random sampling of the given input signal and its randomly “delayed copy”. The samples are therefore randomly taken in a double-dimension space, time and delay. By using a random process in the time domain with a recursive mean previously introduced by the authors in order to avoid any bandwidth limitation due to the sampling strategy, it was shown both theoretically and through simulation that the estimate of the power spectral components is asymptotically unbiased on the unique hypothesis of a synchronized random sampling in the delay domain, i.e. the sampling delays are uniformly distributed in an interval equal to the period of the input signal. The simulation results confirm the theoretical findings
Keywords :
correlation methods; delays; digital simulation; random processes; signal sampling; spectral analysers; autocorrelation function; bandwidth limitation; broadband power spectrum analyzer; delay domain; double-dimension space; input signal; mean sampling time; power spectral components; power spectrum analyzer; random process; randomly delayed copy; recursive mean; sampling delays; sampling strategy; simulation results; simultaneous random sampling; spectral components; synchronized random sampling; twin-channel delayed sampling; Autocorrelation; Bandwidth; Delay effects; Delay estimation; Random processes; Recursive estimation; Sampling methods; Signal processing; Signal sampling; Spectral analysis;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1998. IMTC/98. Conference Proceedings. IEEE
Conference_Location :
St. Paul, MN
Print_ISBN :
0-7803-4797-8
DOI :
10.1109/IMTC.1998.679873