Title :
A novel noise figure and gain test set for microwave devices
Author :
Paola, Alessandra Di ; Sannino, Mario ; Amore, Giovanni D.
Author_Institution :
Dipt. di Ingegneria Elettrica, Palermo Univ., Italy
Abstract :
A new instrument for the measurement of noise and gain of microwave devices is presented. It differs for the commercial ones in the execution of the gain measurement and it is also useful for measuring mismatched devices such as transistors. The instrument is driven via HP-IB by a PC, a user-friendly virtual panel is designed to perform all the required operation including the possibility of correcting kind of errors (second-stage contribution, ENR variations, temperature variation, etc.). The good performances of the instrument are compared with commercial instrumentation
Keywords :
automatic test equipment; electric noise measurement; electron device testing; gain measurement; microcomputer applications; microwave devices; microwave measurement; virtual machines; ENR variations; HP-IB; PC; errors; gain measurement; gain test set; microwave devices; mismatched devices; noise figure; temperature variation; user-friendly virtual panel; Error correction; Gain measurement; Instruments; Microwave devices; Microwave measurements; Microwave transistors; Noise figure; Noise measurement; Temperature; Testing;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1998. IMTC/98. Conference Proceedings. IEEE
Conference_Location :
St. Paul, MN
Print_ISBN :
0-7803-4797-8
DOI :
10.1109/IMTC.1998.679874
