DocumentCode
1870207
Title
Hardware-friendly descreening
Author
Siddiqui, Hasib ; Boutin, Mireille ; Bouman, Charles A.
Author_Institution
Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN
fYear
2008
fDate
12-15 Oct. 2008
Firstpage
1740
Lastpage
1743
Abstract
Conventional electrophotographic printers tend to produce Moire artifacts when used for printing images scanned from printed material such as books and magazines. Inspired by anisotropic diffusion, we propose a novel non-iterative, non-linear, and space-variant de- screening filter that removes a wide range of Moire-causing screen frequencies in a scanned document while preserving image sharpness and edge detail. The amount of diffusion of the image intensity resulting from applying the filter is governed by an estimate of the gradient that is robust under halftone noise. More precisely, the filter extracts a spatial feature vector comprising local intensity gradients estimated from a local window in a pre-smoothed version of the noisy input image. Tunable non-linear polynomial functions of this feature vector are then used to perform one iteration of a discrete diffusion controlled by the intensity gradient. We compare the performance of the proposed algorithm to other descreening solutions and demonstrate that the new algorithm improves quality over the existing methods while reducing computation.
Keywords
electrophotography; feature extraction; filtering theory; image processing; polynomials; printing; Moire artifacts; anisotropic diffusion; descreening filter; edge detail; electrophotographic printers; hardware-friendly descreening; image printing; image sharpness; noisy input image; scanned document; tunable nonlinear polynomial functions; Anisotropic magnetoresistance; Books; Clustering algorithms; Filters; Frequency; Hardware; Noise robustness; Nonlinear equations; Printers; Printing; Halftone; Moiré artifacts; anisotropic diffusion; descreening;
fLanguage
English
Publisher
ieee
Conference_Titel
Image Processing, 2008. ICIP 2008. 15th IEEE International Conference on
Conference_Location
San Diego, CA
ISSN
1522-4880
Print_ISBN
978-1-4244-1765-0
Electronic_ISBN
1522-4880
Type
conf
DOI
10.1109/ICIP.2008.4712111
Filename
4712111
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