Title :
A Stack-Based Single Disk Failure Recovery Scheme for Erasure Coded Storage Systems
Author :
Yingxun Fu ; Jiwu Shu ; Xianghong Luo
Author_Institution :
Dept. of Comput. Sci. & Technol., Tsinghua Univ., Beijing, China
Abstract :
The fast growing of data scale encourages the wide employment of data disks with large storage capacity. However, a mass of data disks´ equipment will in turn increase the probability of data loss or damage, because of the appearance of various kinds of disk failures. To ensure the intactness of the hosted data, modern storage systems usually adopt erasure codes, which can recover the lost data by pre-storing a small amount of redundant information. As the most common case among all the recovery mechanisms, the single disk failure recovery has been receiving intensive attentions for the past few years. However, most of existing works in this literature still take the stripe-level recovery as their only consideration, and a considerable performance improvement on single failure disk reconstruction in the stack-level (i.e., a group of rotated stripes) is missed. To seize this potential improvement, in this paper we systematically study the problem of single failure recovery in the stack-level. We first propose our recovery mechanism based on greedy algorithm to seek for the near-optimal solution (BP-Scheme) for any erasure array code in stack level, and further design a rotated recovery algorithm (RR-Algorithm) to eliminate the size of required memory. Through a rigorous statistic analysis and intensive evaluation on a real system, the results show that BP-Scheme gains at most 38.9% higher recovery speed than Khan´s Scheme, and owns up to 34.8% higher recovery speed than Luo´s U-Scheme.
Keywords :
greedy algorithms; statistical analysis; storage management; system recovery; BP-Scheme; RR-algorithm; erasure array code; erasure coded storage systems; greedy algorithm; rotated recovery algorithm; stack-based single disk failure recovery scheme; statistic analysis; Algorithm design and analysis; Approximation algorithms; Arrays; Equations; Generators; Silicon; Simulated annealing; erasure code; single failure recovery; stack; storage system;
Conference_Titel :
Reliable Distributed Systems (SRDS), 2014 IEEE 33rd International Symposium on
Conference_Location :
Nara
DOI :
10.1109/SRDS.2014.29