• DocumentCode
    1870354
  • Title

    Multilayer etch masks for 3-dimensional fabrication of robust silicon carbide microstructures

  • Author

    Dowling, Karen M. ; Suria, Ateeq J. ; Shankar, Ashwin ; Chapin, Caitlin A. ; Senesky, Debbie G.

  • Author_Institution
    Electr. Eng. Dept., Stanford Univ., Stanford, CA, USA
  • fYear
    2015
  • fDate
    18-22 Jan. 2015
  • Firstpage
    284
  • Lastpage
    287
  • Abstract
    This paper details the creation of 3-dimensional (3-D) microstructures in 4H-silicon carbide (4H-SiC) substrates with a plasma etch process that utilizes multilayer etch masks. An inductively coupled plasma (ICP) etch process (SF6/O2) for SiC was developed and etch rates as high as ~1 μm/min, a selectivity of 60:1 (SiC to Ni), and aspect ratio dependent etch characteristics were demonstrated. In addition, the selectivity of atomic layer deposited (ALD) Al2O3 etch masks to 4H-SiC is reported for the first time. Using this unique process, the microfabrication of complex microstructures (mechanical gears, Lego®-like bricks, and poker chips) is presented. The use of 4H-SiC as the structural material enables such microstructures to be utilized under high cycles of wear, within elevated temperatures, and within chemically corrosive environments.
  • Keywords
    alumina; atomic layer deposition; masks; microfabrication; silicon compounds; sputter etching; wide band gap semiconductors; 3-dimensional fabrication; 3D microstructures; Al2O3; H-SiC; ICP; Lego-like bricks; aspect ratio dependent etch characteristics; atomic layer deposited etch masks; chemically corrosive environments; complex microstructure microfabrication; inductively coupled plasma etch process; mechanical gears; multilayer etch masks; poker chips; robust silicon carbide microstructures; structural material; Aluminum oxide; Etching; Microstructure; Nickel; Nonhomogeneous media; Plasmas; Silicon carbide;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Micro Electro Mechanical Systems (MEMS), 2015 28th IEEE International Conference on
  • Conference_Location
    Estoril
  • Type

    conf

  • DOI
    10.1109/MEMSYS.2015.7050944
  • Filename
    7050944