• DocumentCode
    1870443
  • Title

    Three-dimensional integration of suspended single-crystalline silicon MEMS arrays with CMOS

  • Author

    Zhen Song ; Yuxin Du ; Miao Liu ; Shujie Yang ; Dong Wu ; Zheyao Wang

  • Author_Institution
    Tsinghua Nat. Lab. for Inf. Sci. & Technol., Tsinghua Univ., Beijing, China
  • fYear
    2015
  • fDate
    18-22 Jan. 2015
  • Firstpage
    304
  • Lastpage
    307
  • Abstract
    We present a generic three-dimensional (3-D) integration method to fabricate suspended single crystalline silicon (SCS) MEMS arrays on CMOS. The method is based on transferring the SCS device layer of SOI on the top of CMOS. For general purpose, thin MEMS arrays with long supporting arms are demonstrated. The fabrication process is clarified in details. Mechanical reliability of the suspended structure is addressed with drop tests and is improved by optimizing the Cu plating parameters. The residue stress is compensated by tailoring the thickness of the oxide layer and flat free-standing structures are achieved. This method is applicable to a large variety of SCS MEMS including accelerometers, gyroscopes, micro-mirrors, RF MEMS switches, and resonators.
  • Keywords
    CMOS integrated circuits; copper; electroplating; micromechanical devices; reliability; silicon-on-insulator; CMOS integrated circuit; Cu; Cu plating parameters; SCS device layer; SOI; Si; drop tests; flat free-standing structures; long supporting arms; mechanical reliability; oxide layer; residue stress; suspended single-crystalline silicon MEMS arrays; suspended structure; three-dimensional integration; Bonding; CMOS integrated circuits; Etching; Micromechanical devices; Reliability; Silicon; Stress;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Micro Electro Mechanical Systems (MEMS), 2015 28th IEEE International Conference on
  • Conference_Location
    Estoril
  • Type

    conf

  • DOI
    10.1109/MEMSYS.2015.7050949
  • Filename
    7050949