DocumentCode
1870443
Title
Three-dimensional integration of suspended single-crystalline silicon MEMS arrays with CMOS
Author
Zhen Song ; Yuxin Du ; Miao Liu ; Shujie Yang ; Dong Wu ; Zheyao Wang
Author_Institution
Tsinghua Nat. Lab. for Inf. Sci. & Technol., Tsinghua Univ., Beijing, China
fYear
2015
fDate
18-22 Jan. 2015
Firstpage
304
Lastpage
307
Abstract
We present a generic three-dimensional (3-D) integration method to fabricate suspended single crystalline silicon (SCS) MEMS arrays on CMOS. The method is based on transferring the SCS device layer of SOI on the top of CMOS. For general purpose, thin MEMS arrays with long supporting arms are demonstrated. The fabrication process is clarified in details. Mechanical reliability of the suspended structure is addressed with drop tests and is improved by optimizing the Cu plating parameters. The residue stress is compensated by tailoring the thickness of the oxide layer and flat free-standing structures are achieved. This method is applicable to a large variety of SCS MEMS including accelerometers, gyroscopes, micro-mirrors, RF MEMS switches, and resonators.
Keywords
CMOS integrated circuits; copper; electroplating; micromechanical devices; reliability; silicon-on-insulator; CMOS integrated circuit; Cu; Cu plating parameters; SCS device layer; SOI; Si; drop tests; flat free-standing structures; long supporting arms; mechanical reliability; oxide layer; residue stress; suspended single-crystalline silicon MEMS arrays; suspended structure; three-dimensional integration; Bonding; CMOS integrated circuits; Etching; Micromechanical devices; Reliability; Silicon; Stress;
fLanguage
English
Publisher
ieee
Conference_Titel
Micro Electro Mechanical Systems (MEMS), 2015 28th IEEE International Conference on
Conference_Location
Estoril
Type
conf
DOI
10.1109/MEMSYS.2015.7050949
Filename
7050949
Link To Document