Research on method of the fault diagnosis for digital circuits

Efficient diagnosis of faults in digital circuits requires high quality diagnostic test sets that are generated by effective algorithm. In this work, novel optimization algorithms for diagnostic test generation are proposed that require significantly less time than previous methods. The diagnostic test generation is performed using particle swarm optimization (PSO) or improved PSO, and fault simulator. Experimental results illustrate the effectiveness of the approach. STPG based on improved PSO is generally superior to both GA-based STPG and PSO-based STPG in terms of achieved fault coverage and required CPU time