Spectral photoluminescence measurements for in-line absorber characterization in thin-film production lines

Author

Uredat, Steffen ; Lange, Thomas ; Schenk, Tobias

Author_Institution

LayTec in-line GmbH, Berlin, Germany

fYear

2011

fDate

19-24 June 2011

Abstract

The cell efficiency of CIGS thin-film modules is highly influenced by the composition of the absorber layer. An in line monitoring of the absorber composition within the production process should hence be of fundamental interest to assure a constantly high quality of produced modules, to correct drifts within the production as soon as they occur and to identify rejects immediately. We have developed an optical system measuring photoluminescence (PL) spectra in thin-film production processes. Applications for this technique are in-line composition monitoring in CIGS layers and band-gap determination in CdTe and CdS layers.

Keywords

cadmium compounds; copper compounds; energy gap; gallium compounds; indium compounds; photoluminescence; selenium compounds; solar absorber-convertors; solar cells; ternary semiconductors; thin films; CIGS layers; CIGS thin-film modules; PL spectra; absorber composition; absorber layer; band-gap determination; cell efficiency; in line monitoring; in-line absorber characterization; in-line composition monitoring; optical system measuring photoluminescence spectra; produced modules; spectral photoluminescence measurements; thin-film production lines; thin-film production processes; Adaptive optics; Optical fiber sensors; Optical fibers; Optical variables measurement; Production;

fLanguage

English

Publisher

ieee

Conference_Titel

Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE

Conference_Location

Seattle, WA

ISSN

0160-8371

Print_ISBN

978-1-4244-9966-3

Type

conf

DOI

10.1109/PVSC.2011.6186532

Filename

6186532