Title :
Boundary-scan: beyond production test
Author_Institution :
Self-Test Services, Ambler, PA
Abstract :
The use of boundary-scan, as specified in IEEE 1149.1-1990, has always been considered a source of major benefits for the production test process. However, there are many existing and potential applications of boundary-scan during other life cycle phases of a product-the design phase and field operation and support phase. This paper focuses on these additional phases of boundary-scan application
Keywords :
boundary scan testing; built-in self test; integrated circuit testing; logic testing; production testing; BIST; IEEE 1149.1-1990; boundary-scan; design phase; field operation; life cycle phases; production test; support phase; Built-in self-test; Circuit testing; Connectors; Debugging; Emulation; Hardware; Production; Prototypes; Software prototyping; System testing;
Conference_Titel :
VLSI Test Symposium, 1994. Proceedings., 12th IEEE
Conference_Location :
Cherry Hill, NJ
Print_ISBN :
0-8186-5440-6
DOI :
10.1109/VTEST.1994.292280
