• DocumentCode
    1871245
  • Title

    Optical and passivating properties of sol-gel derived silica and titania coatings on textured monocrystalline silicon

  • Author

    Petersson, Anna Malou ; Lindberg, Per ; Boström, Tobias

  • Author_Institution
    Northern Res. Inst. (Norut) Narvik AS, Narvik, Norway
  • fYear
    2011
  • fDate
    19-24 June 2011
  • Abstract
    In standard solar cell fabrication, silicon nitride is applied to the front surface by plasma enhanced chemical vapor deposition. The layer serves as an antireflective coating and provides passivation, but is costly to produce. An interesting alternative of making thin films is the sol-gel technique. The process is simple, cheap and low-temperature. In the present study, silica and titania sol-gel coatings were applied to textured and polished monocrystalline silicon wafers and subsequently annealed in a furnace. On polished wafers, the solar averaged reflectance was decreased from 0.37 to 0.11 with a titania layer and to 0.25 with a silica layer. The deviation in reflectance did not translate onto textured wafers. The reflectances of these wafers were decreased from about 0.13 to about 0.08 independently of coating type. The layers were not found to passivate the surface. The layers are promising in terms of reflectance, but to improve passivation properties new approaches are necessary.
  • Keywords
    annealing; elemental semiconductors; semiconductor thin films; silicon; silicon compounds; sol-gel processing; solar cells; titanium compounds; annealing; antireflective coating; optical properties; passivating properties; plasma-enhanced chemical vapor deposition; polished monocrystalline silicon wafer; silicon nitride; sol-gel-derived silica coating; sol-gel-derived titania coating; standard solar cell fabrication; textured monocrystalline silicon wafer; thin films; wafer reflectance; Coatings; Films; Passivation; Reflectivity; Silicon; Silicon compounds;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE
  • Conference_Location
    Seattle, WA
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-9966-3
  • Type

    conf

  • DOI
    10.1109/PVSC.2011.6186556
  • Filename
    6186556