DocumentCode
1871328
Title
An industrial experience in the built-in self test of embedded RAMs
Author
Camurati, P. ; Prinetto, P. ; Reorda, M. Sonza ; Barbagallo, S. ; Burri, A. ; Medina, D.
Author_Institution
Dipartimento di Autom. e Inf., Politecnico di Torino, Italy
fYear
1994
fDate
25-28 Apr 1994
Firstpage
306
Lastpage
311
Abstract
High-quality embedded memory testing is increasingly important and a BIST scheme seems advantageous. Industrial experience at Italtel, a telecom company, confirms it. The scheme implements in hardware the test pattern generation algorithm proposed by R. Nair, S.M. Thatte, and J.A. Abraham [1978], extending it to word-based memories. Several goodness criteria are satisfied, as the experimental results confirm
Keywords
built-in self test; integrated circuit testing; integrated memory circuits; random-access storage; Italtel; built-in self test; embedded RAMs; embedded memory testing; goodness criteria; test pattern generation algorithm; word-based memories; Automatic testing; Built-in self-test; Communication industry; Decoding; Fault detection; Hardware; Random access memory; Read-write memory; Telecommunications; Test pattern generators;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 1994. Proceedings., 12th IEEE
Conference_Location
Cherry Hill, NJ
Print_ISBN
0-8186-5440-6
Type
conf
DOI
10.1109/VTEST.1994.292296
Filename
292296
Link To Document