Title :
Designing self-exercising analogue checkers
Author :
Kolarik, Vladimir ; Lubaszewski, Marcelo ; Courtois, Bernard
Author_Institution :
TIMA/INPG, Grenoble, France
Abstract :
The design of checkers suitable for concurrent error detection in analogue and mixed-signal circuits is addressed in this paper. These checkers can on-line test duplicated and fully differential analogue functional circuits and comply with existing digital self-checking parts. A test pattern generator for off-line testing of the checkers is proposed, which fully exercises their capability of signalling functional error occurrences
Keywords :
analogue circuits; error detection; integrated circuit testing; linear integrated circuits; mixed analogue-digital integrated circuits; analogue circuits; concurrent error detection; duplicated circuits; fully differential circuits; functional error occurrences; mixed-signal circuits; offline testing; online test; self-exercising analogue checkers; test pattern generator; Analog-digital conversion; Automatic testing; Automotive engineering; Circuit faults; Circuit testing; Digital integrated circuits; Rail transportation; Safety; System testing; Test pattern generators;
Conference_Titel :
VLSI Test Symposium, 1994. Proceedings., 12th IEEE
Conference_Location :
Cherry Hill, NJ
Print_ISBN :
0-8186-5440-6
DOI :
10.1109/VTEST.1994.292304
