• DocumentCode
    1871615
  • Title

    Improved prediction of the intermodulation distortion characteristics of MESFETs and PHEMTs via a robust nonlinear device model

  • Author

    Cojocaru, V.I. ; Brazil, T.J.

  • Author_Institution
    Dept. of Electron. & Electr. Eng., Univ. Coll. Dublin, Ireland
  • Volume
    2
  • fYear
    1998
  • fDate
    7-12 June 1998
  • Firstpage
    749
  • Abstract
    The paper investigates the intermodulation distortion (IMD) prediction capabilities of the COBRA model by analysing the first, second and third order derivatives of the drain I/V model and the gate Q/V model. The model is extracted simply from DC and small-signal S-parameter data, without the need for complex low-frequency (VHF) measurements of harmonic output levels under low-load conditions, as proposed in previous studies. The computed main I/V characteristic and its derivatives are shown to be continuous over the entire bias plane, and are proven to give better results than other models available. Results of two-tone large signal tests for the case of a 0.2 /spl mu/m PHEMT process are presented, showing excellent agreement between simulated and experimental third and fifth intermodulation products.
  • Keywords
    S-parameters; Schottky gate field effect transistors; UHF field effect transistors; high electron mobility transistors; intermodulation distortion; microwave field effect transistors; semiconductor device models; 0.2 micron; COBRA model; I/V characteristic; IMD characteristics prediction; MESFETs; PHEMTs; drain I/V model; gate Q/V model; intermodulation distortion; pseudomorphic HEMT; robust nonlinear device model; small-signal S-parameter data; two-tone large signal tests; Data mining; Educational institutions; Intermodulation distortion; Intrusion detection; MESFETs; Microwave FETs; PHEMTs; Predictive models; Radio frequency; Robustness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 1998 IEEE MTT-S International
  • Conference_Location
    Baltimore, MD, USA
  • ISSN
    0149-645X
  • Print_ISBN
    0-7803-4471-5
  • Type

    conf

  • DOI
    10.1109/MWSYM.1998.705099
  • Filename
    705099