• DocumentCode
    1871713
  • Title

    The effect of H2 treatment on heterojunction with intrinsic thin layer (HIT) solar cell perfromance using 40.68MHz VHF-PECVD system

  • Author

    Huang, Man-Chi ; Chang, Chia-Hua ; Li, Fang-Ming ; Hsu, Ching-Hsiang ; Tran, Binh-Tinh ; Tang, S.S. ; Lin, Kung-Liang ; Lin, Yueh-Chin ; Tung, Fu-Ching ; Liang, Muh-Wang ; Yi-Chang, Edward

  • Author_Institution
    Dept. of Mater. Sci. & Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
  • fYear
    2011
  • fDate
    19-24 June 2011
  • Abstract
    In this report, we studied the fabrication of heterojunction with intrinsic thin layer (HIT) solar cell, which was deposited by using very high frequency chemical vapor deposition (VHF-PECVD), at a high deposition rate under a low process temperature. The HIT solar cell has a very thin emitter layer on the light-incident surface (about 10nm) and the contact region was passivated by hydrogen (H2) plasma treatment to improve solar cell performance. With the passivation, the carrier transport may be enhanced and the extraction of photo current may also be increased. These features can make the Si-bulk absorbs more photons and extract more photo-electric current [1].
  • Keywords
    elemental semiconductors; plasma CVD; semiconductor heterojunctions; silicon; solar cells; H2 treatment; HIT solar cell perfromance; VHF-PECVD system; carrier transport; contact region; emitter layer; frequency 40.68 MHz; heterojunction-with-intrinsic thin-layer solar cell perfromance; hydrogen plasma treatment; light-incident surface; low-process temperature; photo current extraction; photoelectric current; silicon bulk; very-high-frequency chemical vapor deposition; Films; Performance evaluation; Photovoltaic cells; Plasma temperature; Sputtering; Surface treatment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE
  • Conference_Location
    Seattle, WA
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-9966-3
  • Type

    conf

  • DOI
    10.1109/PVSC.2011.6186575
  • Filename
    6186575