Title :
Quality impacts of non-uniform fault coverage
Author :
Maxwell, Peter C.
Author_Institution :
Integrated Circuits Business Div., Hewlett-Packard Co., Palo Alto, CA, USA
Abstract :
This paper addresses the issue of non-uniform distribution of detected faults. It is shown that there is a very big difference in final quality between covering the chip all over and leaving parts relatively untested, even if the coverage is the same in both cases
Keywords :
fault location; integrated circuit testing; probability; quality control; IC testing; nonuniform distribution; nonuniform fault coverage; quality level; Circuit faults; Circuit testing; Companies; Electrical fault detection; Fault detection; Integrated circuit technology; Integrated circuit testing;
Conference_Titel :
VLSI Test Symposium, 1994. Proceedings., 12th IEEE
Conference_Location :
Cherry Hill, NJ
Print_ISBN :
0-8186-5440-6
DOI :
10.1109/VTEST.1994.292313
