Title :
On the complexity of terminal stuck-at fault detection tests for monotone Boolean functions
Author_Institution :
Inst. of Inf. & Automation Problems, Acad. of Sci., Yerevan, Armenia
Abstract :
Upper and lower bounds are obtained on the minimum length of tests detecting single and multiple stuck-at-0 and stuck-at-1 faults at input/output terminals of combinational logic networks realizing monotone Boolean functions of n variables
Keywords :
Boolean functions; combinatorial circuits; fault location; logic testing; combinational logic networks; input/output terminals; minimum length; monotone Boolean functions; stuck-at-0 faults; stuck-at-1 faults; terminal stuck-at fault detection tests; Automatic testing; Boolean functions; Circuit faults; Circuit testing; Combinational circuits; Electrical fault detection; Fault detection; Integrated circuit testing; Logic testing; Very large scale integration;
Conference_Titel :
VLSI Test Symposium, 1994. Proceedings., 12th IEEE
Conference_Location :
Cherry Hill, NJ
Print_ISBN :
0-8186-5440-6
DOI :
10.1109/VTEST.1994.292316
