Title :
On-line delay testing of digital circuits
Author :
Franco, Piero ; McCluskey, Edward J.
Author_Institution :
Center for Reliable Comput., Stanford Univ., CA, USA
Abstract :
A new technique for on-line checking of digital systems is proposed. It is shown that, under certain timing restrictions, an off-line delay-fault testing method called Stability Checking can be used for on-line checking. Efficient CMOS on-line Stability Checker designs are presented, and an algorithm for meeting timing restrictions is described. Benchmark results are shown. On-line Stability Checkers detect errors caused by most common reliability failures and transients, and are shown to perform almost as well as duplication at a fraction of the hardware cost. Since outputs are checked independently, good diagnosability is possible
Keywords :
CMOS integrated circuits; circuit reliability; combinatorial circuits; integrated logic circuits; logic testing; CMOS; diagnosability; digital circuits; off-line delay-fault testing method; on-line delay testing; reliability failures; stability checking; timing restrictions; transients; Algorithm design and analysis; Benchmark testing; Circuit stability; Circuit testing; Costs; Delay; Digital circuits; Digital systems; Hardware; Timing;
Conference_Titel :
VLSI Test Symposium, 1994. Proceedings., 12th IEEE
Conference_Location :
Cherry Hill, NJ
Print_ISBN :
0-8186-5440-6
DOI :
10.1109/VTEST.1994.292318