DocumentCode
1871919
Title
Detailed analysis of I/O traces for large scale applications
Author
Nakka, N. ; Choudhary, A. ; Liao, W.K. ; Ward, L. ; Klundt, R. ; Weston, M.I.
Author_Institution
Electr. Eng. & Comput. Sci., Northwestern Univ., Evanston, IL, USA
fYear
2009
fDate
16-19 Dec. 2009
Firstpage
419
Lastpage
427
Abstract
In this paper, we present a tool to extract I/O traces from very large applications running at full scale during their production runs. We analyze these traces to gain information about the application. We analyze the traces of three applications. The analysis showed that the I/O traces reveal much information about the application even without access to the source code. In particular, these I/O traces provide multiple indications towards the algorithmic nature of the application by observing the changes of data amount and I/O request distribution at the checkpoints. Adaptive Mesh Refinement (AMR) is one of the kind of algorithms that can exhibit such I/O behavior. This is the first study of I/O characteristics of unbalanced AMR-supported applications at scale. The key observations that we made in the trace were (1) Variation in aggregate data sizes across checkpoints for AMR and non-AMR applications, (2) Variation in the number of I/O calls by a client depending on the nature of the application, (3) Use of temporary files by applications and possible erroneous calls to I/O functions, (4) Variation in average data transfer size according as whether the application has AMR support or not, (5) Aggregation of I/O for processes executing on a single physical node through MPI-IO calls, and (6) Updates to specific data structures in the checkpoint file.
Keywords
distributed processing; input-output programs; I/O calls variation; I/O traces; adaptive mesh refinement; aggregate data size variation; checkpoint file; data structure update; data transfer size variation; large scale applications; processes execution aggregation; temporary files usage; Adaptive mesh refinement; Application software; Computer science; Data mining; File systems; Information analysis; Laboratories; Large-scale systems; Operating systems; Production; I/O trace analysis; Large scale I/O tracing; adaptive mesh refinement;
fLanguage
English
Publisher
ieee
Conference_Titel
High Performance Computing (HiPC), 2009 International Conference on
Conference_Location
Kochi
Print_ISBN
978-1-4244-4922-4
Electronic_ISBN
978-1-4244-4921-7
Type
conf
DOI
10.1109/HIPC.2009.5433186
Filename
5433186
Link To Document