• DocumentCode
    1871940
  • Title

    Complex permittivity characterization of textile materials by means of surrogate modelling

  • Author

    Declercq, Frederick ; Couckuyt, Ivo ; Rogier, Hendrik ; Dhaene, Tom

  • Author_Institution
    INTEC, Ghent Univ., Ghent, Belgium
  • fYear
    2010
  • fDate
    11-17 July 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    In this paper, we perform electromagnetic characterization of textile materials by means of fitting simulated and measured textile antenna performances. The process is automated by using an optimization method based on kriging surrogate models. More in particular, we apply expected improvement (EI) as implemented in a flexible research platform called the Surrogate Modelling (SUMO) Toolbox. Previously, kriging surrogate models were used for EM device optimization, in which the surrogate model is then optimized instead of an expensive simulation. Here, we convert the inverse problem to a forward optimization problem by minimizing an error function between the simulated and measured data. Results of two different textile materials serving as antenna substrate are presented and compared with the results obtained by a direct measurement method in which the electromagnetic properties are determined based on microstrip line measurements.
  • Keywords
    electromagnetic waves; microstrip antennas; microstrip lines; EM device optimization; SUMO toolbox; antenna substrate; complex permittivity characterization; direct measurement method; electromagnetic characterization; electromagnetic property; error function; expected improvement; flexible research platform; forward optimization problem; inverse problem; kriging surrogate models; microstrip line measurements; optimization method; surrogate modelling toolbox; textile antenna performances; textile materials; Antenna measurements; Antennas; Cost function; Electromagnetics; Frequency measurement; Substrates; Textiles;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium (APSURSI), 2010 IEEE
  • Conference_Location
    Toronto, ON
  • ISSN
    1522-3965
  • Print_ISBN
    978-1-4244-4967-5
  • Type

    conf

  • DOI
    10.1109/APS.2010.5561037
  • Filename
    5561037