Title :
Multiple weighted cellular automata
Author :
Neebel, Danial J. ; Kime, Charles R.
Author_Institution :
Dept. of Electr. & Comput. Eng., Wisconsin Univ., Madison, WI, USA
Abstract :
Presents a complete design method for inhomogeneous cellular automata capable of generating BIST patterns with multiple weight sets at a test per clock rate. The method achieves 100% stuck-at fault coverage of detectable faults for almost all combinational benchmark circuits having random pattern resistant faults. The authors also present data showing the overall speed up relative to test per scan methods
Keywords :
boundary scan testing; built-in self test; cellular automata; combinatorial circuits; combinatorial switching; fault location; logic CAD; logic testing; BIST patterns; combinational benchmark circuits; detectable faults; inhomogeneous cellular automata; multiple weight sets; multiple weighted cellular automata; random pattern resistant faults; stuck-at fault coverage; test per scan methods; Automatic test pattern generation; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Clocks; Design methodology; Electrical fault detection; Fault detection; Test pattern generators;
Conference_Titel :
VLSI Test Symposium, 1994. Proceedings., 12th IEEE
Conference_Location :
Cherry Hill, NJ
Print_ISBN :
0-8186-5440-6
DOI :
10.1109/VTEST.1994.292330
