A BIST technique for a frequency response and intermodulation distortion test of a sigma-delta ADC

Author

Toner, M.F. ; Roberts, G.W.

Author_Institution

Dept. of Electr. Eng., McGill Univ., Montreal, Que., Canada

fYear

1994

fDate

25-28 Apr 1994

Firstpage

60

Lastpage

65

Abstract

Built-in-self-test (BIST) for VLSI systems is desirable for production-time testing and in the field diagnostics. This paper discusses a Mixed Analog Digital BIST (MADBIST) for a frequency response test and an intermodulation distortion test of an Analog-to-Digital converter. The MADBIST strategy for the FR and IMD tests of the ADC is introduced, accuracy issues are discussed, and preliminary experimental results are presented

Keywords

VLSI; analogue-digital conversion; built-in self test; delta modulation; frequency response; integrated circuit testing; intermodulation; mixed analogue-digital integrated circuits; production testing; BIST technique; IMD tests; MADBIST; VLSI systems; accuracy issues; analog-to-digital converter; frequency response; intermodulation distortion test; mixed analog digital BIST; production-time testing; sigma-delta ADC; Analog-digital conversion; Automatic testing; Built-in self-test; Circuit testing; Costs; Delta-sigma modulation; Digital-analog conversion; Frequency response; Intermodulation distortion; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI Test Symposium, 1994. Proceedings., 12th IEEE

Conference_Location

Cherry Hill, NJ

Print_ISBN

0-8186-5440-6

Type

conf

DOI

10.1109/VTEST.1994.292333

Filename

292333