Title :
A new strategy for testing analog filters
Author :
Vazquez, D. ; Rueda, A. ; Huertas, J.L.
Author_Institution :
Centro Nacional de Microelectronica, Seville Univ., Spain
Abstract :
A new strategy for testing analog filters is presented, based on the reevaluation of the transfer function followed by simple processing of the output signals. Taking advantage of the structural properties of some universal biquads, this new strategy consists in provoking pole-zero cancellation during the test mode, without eliminating information about parameters which determine the normal circuit operation. Although area overhead could seem high, it can be very small in many applications
Keywords :
active filters; design for testability; integrated circuit testing; linear integrated circuits; poles and zeros; transfer functions; DFT strategy; analog filters; analogue ICs; output signal processing; pole-zero cancellation; testing strategy; transfer function; universal biquads; Adders; Circuit faults; Circuit testing; Fabrication; Filters; Integrated circuit layout; Process design; Signal generators; Signal processing; Transfer functions;
Conference_Titel :
VLSI Test Symposium, 1994. Proceedings., 12th IEEE
Conference_Location :
Cherry Hill, NJ
Print_ISBN :
0-8186-5440-6
DOI :
10.1109/VTEST.1994.292337
