DocumentCode :
1872542
Title :
Assessing the reliability and degradation of ribbon in photovoltaic module
Author :
Huang, Chiu-Hua ; Chih, Liu-De ; Chen, Yi-Chia ; Huang, Ming-Yuan ; Wu, Zhen-Cheng ; Ho, Shyuan-Jeng
Author_Institution :
AU OPTRONICS Corp., Taichung, Taiwan
fYear :
2011
fDate :
19-24 June 2011
Abstract :
Yellowing of modules represents the most evident visual defect. It appears on 98% of the plant modules and, for 63% of panels, it strongly covers their entire background tedlar. In order to see if this yellowing effects the output of the modules the surface oxidation composition and thickness were measured. This letter reports how AUO solar utilizes Highly Accelerated & Humidity Stress Test (HAST) to determine ribbon yellowing effect, and the expected surface oxidation composition. In the same time we identify the surface oxidation rate. The result indicates that ribbon yellowness is a result of surface oxidation, and the yellow appearance is only a cosmetic issue. Lead-free ribbons are more vulnerable to yellowing because lead does not build oxides, only Tin does. The higher concentration of Tin in lead-free solder suggests it will exhibit yellowing relatively faster and easier.
Keywords :
humidity; oxidation; reliability; silver alloys; solar cells; solders; tin alloys; AUO solar; HAST; SnAg; highly accelerated & humidity stress test; lead-free ribbons; lead-free solder; photovoltaic module; plant modules; ribbon degradation; ribbon reliability; ribbon yellowing effect; surface oxidation composition; surface oxidation thickness; visual defect; Copper; Humidity; Lead; Life estimation; Oxidation; Stress; Tin;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE
Conference_Location :
Seattle, WA
ISSN :
0160-8371
Print_ISBN :
978-1-4244-9966-3
Type :
conf
DOI :
10.1109/PVSC.2011.6186609
Filename :
6186609
Link To Document :
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