DocumentCode :
1872842
Title :
Millimeter wave design with 65 nm LP SOI HR CMOS technology
Author :
Martineau, B. ; Douyere, S. ; Cathelin, A. ; Danneville, F. ; Raynaud, C. ; Dambrine, G. ; Lepilliet, S. ; Gianesello, F. ; Belot, D.
fYear :
2007
fDate :
1-4 Oct. 2007
Firstpage :
123
Lastpage :
124
Abstract :
In this paper, we present active and passive performances of the 65 nm LP SOI HR technology from STMicroelectronics and two simulated circuits to illustrate the potentiality of the technology for millimeter wave (mm-wave) applications. 65 nm low power (LP) partially depleted (PD) n-MOSFET floating body (FB) shows a f/fmax of 160/200 GHz. Coplanar waveguides (CPW) present a measured attenuation constant lower than 1 dB/mm at 60 GHz for 45 Omega and 70 Omega characteristic impedance (Zc). The 60 GHz simulated Low Noise Amplifier (LNA) shows 22 dB gain, an input/output reflection losses <-14 dB and a noise figure (NF) of 5.5 dB while dissipating 72 m W under a 2.4 V supply. The resistive drain pumped mixer shows 7.7 dB conversion losses, a NF of 12 dB for a PLO=-5 dBm (local oscillator power). This architecture shows a simulated linearity performance IP1 dB of - 10 dBm and an IIP3 of 0 dBm with muW power consumption.
Keywords :
CMOS integrated circuits; circuit simulation; coplanar waveguides; field effect MIMIC; low noise amplifiers; low-power electronics; millimetre wave amplifiers; millimetre wave mixers; nanoelectronics; silicon-on-insulator; LP SOI HR CMOS technology; coplanar waveguides; frequency 160 GHz; frequency 200 GHz; frequency 60 GHz; gain 22 dB; loss 7.7 dB; low noise amplifier; low power partially depleted n-MOSFET floating body; noise figure 12 dB; noise figure 5.5 dB; power 72 mW; resistance 45 ohm; resistance 70 ohm; resistive drain pumped mixer; size 65 nm; voltage 2.4 V; Attenuation measurement; CMOS technology; Circuit simulation; Coplanar waveguides; MOSFET circuits; Millimeter wave circuits; Millimeter wave measurements; Millimeter wave technology; Noise figure; Noise measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
SOI Conference, 2007 IEEE International
Conference_Location :
Indian Wells, CA
ISSN :
1078-621X
Print_ISBN :
978-1-4244-0879-5
Electronic_ISBN :
1078-621X
Type :
conf
DOI :
10.1109/SOI.2007.4357883
Filename :
4357883
Link To Document :
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