DocumentCode :
1873013
Title :
Accelerated aging tests on PV grounding connections
Author :
Wang, Ethan ; Yen, Kai-Hsiang ; Wang, Carl ; Ji, Liang ; Zgonena, Timothy
Author_Institution :
Underwriters Labs. Taiwan Co., Taipei, Taiwan
fYear :
2011
fDate :
19-24 June 2011
Abstract :
As many contemporary Photovoltaic (PV) Power systems being installed are designed to produce significant amount of electricity and claimed to operate for 25 years or more, appropriate grounding on PV modules to reduce or eliminate shock and fire hazards becomes a critical issue under high electricity output and long-term use. Although some PV manufacturers have provided technical bulletins to suggest grounding products and methods, not all of them have been carefully evaluated and reviewed by the certification/listing laboratories. In this paper, different types of PV grounding connectors were collected, installed and put into accelerated environmental test chambers. The effects of current cycling, assembly force, anti-oxidation coating application on grounding reliability were evaluated. The grounding failure modes and mechanisms are also discussed in this paper.
Keywords :
ageing; earthing; electric shocks; environmental testing; hazards; life testing; photovoltaic power systems; power generation reliability; PV grounding connection; PV manufacturer; PV power system; accelerated aging testing; accelerated environmental test chamber; antioxidation coating application; assembly force; certification-listing laboratory; current cycling effect; fire hazard elimination; fire hazard reduction; grounding reliability; photovoltaic power system; shock elimination; shock reduction; time 25 year; Aging; Aluminum; Compounds; Connectors; Corrosion; Fasteners; Grounding;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE
Conference_Location :
Seattle, WA
ISSN :
0160-8371
Print_ISBN :
978-1-4244-9966-3
Type :
conf
DOI :
10.1109/PVSC.2011.6186629
Filename :
6186629
Link To Document :
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