Optimization of electron beam focusing for CNT-FEDs

Author

Choi, Jun Hee ; Zoulkarneev, Andrei R. ; Jin, Youg Wan ; Park, Young Jun ; Chung, Denk Seok ; Song, Byung Kwon ; Han, In Taek ; Kim, Ha Jin ; Lee, Hang Woo ; Park, Sang Hyun ; Kang, Ho Snk ; Shin, Mun Jin ; Kim, Ha Jong ; Min, Kynng Won ; Kim, Jung Woo ;

Author_Institution

FED Project Team, Samsung Adv. Inst. of Technol., Suwon, South Korea

fYear

2004

fDate

11-16 July 2004

Firstpage

32

Lastpage

33

Abstract

An electron beam focusing was optimized to obtain high color purity in 38" high definition level carbon nanotube-field emission devices (CNT-FEDs). We could successfully adopted the focusing structure where each CNT dot is aligned to a gate and a focus gate hole, which results in electric field symmetry and makes it easy to focus electron beam. The structure also has a concave geometry. By varying the sizes of the focus gate hole, the optimum I-V conditions are obtained. The fine electron beam focusing even under wide e-beam divergence of CNTs could be achieved.

Keywords

carbon nanotubes; electron beam focusing; field emission displays; 38 inch; C; CNT-FED; I-V conditions; concave geometry; electric field symmetry; fine electron beam focusing; focus gate hole; focusing structure; high color purity; wide e-beam divergence; Anodes; Carbon dioxide; Charge carrier processes; Electron beams; Electron emission; Focusing; Leakage current; Phosphors; Scanning electron microscopy; Vehicles;

fLanguage

English

Publisher

ieee

Conference_Titel

Vacuum Nanoelectronics Conference, 2004. IVNC 2004. Technical Digest of the 17th International

Print_ISBN

0-7803-8397-4

Type

conf

DOI

10.1109/IVNC.2004.1354884

Filename

1354884