DocumentCode
1873368
Title
Black-box modeling of three phase voltage source inverters based on transient response analysis
Author
Valdivia, V. ; Lázaro, A. ; Barrado, A. ; Zumel, P. ; Fernández, C. ; Sanz, M.
Author_Institution
Electron. Technol. Dept., Carlos III Univ. of Madrid, Leganes, Spain
fYear
2010
fDate
21-25 Feb. 2010
Firstpage
1279
Lastpage
1286
Abstract
Nowadays, black-box behavioral models of power converters are becoming interesting for system-level analysis. These models can be used to evaluate the response of power electronics systems which are composed of commercial converters, since they can be fully parameterized by analyzing the actual converter response. First black-box models of power converters have been recently proposed, but all of them are oriented to DC-DC converters. However, three-phase voltage source inverters are usually applied in current power electronics-based systems, such as aircraft power systems, and a black-box modeling method of this kind of converters has not yet been proposed. In this paper a large-signal black-box modeling method of three-phase voltage source inverters is proposed. The identification of the model is based on the analysis of the converter transient response, which is obtained by means of a set of simple experiments and easily usable fitting algorithms. An experimental validation of the proposed method has been carried out on a 5 kW actual inverter applied on an aircraft power system test bench.
Keywords
DC-DC power convertors; invertors; transient response; DC-DC converters; aircraft power systems; black-box modeling; power 5 kW; power converters; power electronics systems; system-level analysis; three phase voltage source inverters; transient response analysis; Aircraft; DC-DC power converters; Inverters; Power electronics; Power system analysis computing; Power system modeling; Power system transients; Transient analysis; Transient response; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Applied Power Electronics Conference and Exposition (APEC), 2010 Twenty-Fifth Annual IEEE
Conference_Location
Palm Springs, CA
ISSN
1048-2334
Print_ISBN
978-1-4244-4782-4
Electronic_ISBN
1048-2334
Type
conf
DOI
10.1109/APEC.2010.5433336
Filename
5433336
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