DocumentCode
1873406
Title
Digital autotuning of dc-dc converters based on model reference impulse response
Author
Costabeber, A. ; Mattavelli, P. ; Saggini, S. ; Bianco, A.
Author_Institution
Dept. of Inf. Eng., Univ. of Padova, Padova, Italy
fYear
2010
fDate
21-25 Feb. 2010
Firstpage
1287
Lastpage
1294
Abstract
This paper proposes an autotuning technique for digitally controlled voltage-mode dc-dc converters based on the model reference approach. The proposed solution uses the difference between the measured system impulse response and the reference one, determined by the desired dynamic performances, and minimizes the error function acting on the regulator parameters. Two different approaches have been investigated for the evaluation of the impulse response: a deterministic one, based on duty cycle impulse, and a statistical one, based on white noise injection. Compared to existing approaches, this solution has the advantage of simplicity, small-signal processing and on-line tuning capabilities. Experimental investigation has been performed on a 20 A, 1.5V synchronous buck converter, and both simulation and experimental results confirm the effectiveness of the proposed solution.
Keywords
DC-DC power convertors; deterministic algorithms; digital control; statistical analysis; tuning; white noise; current 20 A; deterministic approach; digital autotuning; digital control; duty cycle impulse; experimental investigation; model reference impulse response; online tuning capability; regulator parameters; small-signal processing; statistical approach; synchronous buck converter; system impulse response; voltage 1.5 V; voltage-mode dc-dc converters; white noise injection; Automatic control; DC-DC power converters; Digital control; Frequency; Performance evaluation; Phase measurement; Regulators; Switched-mode power supply; Tuning; Voltage control; autotuning; dc-dc converters; impulse response; model reference; on-line tuning; white noise;
fLanguage
English
Publisher
ieee
Conference_Titel
Applied Power Electronics Conference and Exposition (APEC), 2010 Twenty-Fifth Annual IEEE
Conference_Location
Palm Springs, CA
ISSN
1048-2334
Print_ISBN
978-1-4244-4782-4
Electronic_ISBN
1048-2334
Type
conf
DOI
10.1109/APEC.2010.5433337
Filename
5433337
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