Title :
Noncoherently detected trellis-coded partial response CPM on mobile radio channels
Author :
Yiin, Lihbor ; Stuber, Gordon L.
Author_Institution :
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
This paper presents a noncoherent receiver for partial response trellis-coded continuous phase modulation (TC-CPM) on interleaved flat Rician fading channels. By using a multiple-symbol observation interval and a simple metric calculator, the power efficiency is improved as compared to the conventional single-symbol observation interval, without significantly increasing the receiver complexity. Performance bounds on the bit error probability are derived, by defining a set of characteristic distances for CPM signals and showing that TC-CPM is equivalent to a TCM scheme. Our results show that, with the same observation length, the proposed receiver is less than 0.5 dB inferior to the coherent receiver for which perfect channel information is needed. We also conclude that in terms of joint power-bandwidth-complexity, 2RC is the best candidate for rate-1/2 TCM codes
Keywords :
Rician channels; coding errors; continuous phase modulation; error statistics; fading; land mobile radio; partial response channels; probability; radio receivers; signal detection; trellis coded modulation; CPM signals; TC-CPM; bit error probability; characteristic distances; coherent receiver; interleaved flat Rician fading channels; metric calculator; mobile radio channels; multiple symbol observation interval; noncoherent receiver; noncoherently detected trellis-coded CPM; observation length; partial response CPM; perfect channel information; performance bounds; power bandwidth complexity; power efficiency; rate-1/2 TCM codes; receiver complexity; trellis-coded continuous phase modulation; Artificial intelligence; Continuous phase modulation; Convolution; Convolutional codes; Detectors; Fading; Land mobile radio; Maximum likelihood detection; Power system modeling; Receivers;
Conference_Titel :
Vehicular Technology Conference, 1995 IEEE 45th
Conference_Location :
Chicago, IL
Print_ISBN :
0-7803-2742-X
DOI :
10.1109/VETEC.1995.504952