Title :
CVD-SiC for RTP chamber components
Author :
Goela, Jitendra S. ; Brese, Nathaniel E. ; Burns, L.E. ; Pickering, Michael A.
Author_Institution :
Rohm & Haas Adv. Mater., Woburn, MA, USA
Abstract :
The CVD manufacturing process, important properties and applications of CVD SILICON CARBIDE® in advanced thermal processing of semiconductors are presented. CVD-SiC is produced by the pyrolysis of methyltrichlorosilane, in excess H2, in a low-pressure CVD reactor, which produces a theoretically dense, void-free, highly pure, polycrystalline material with high oxidation, thermal shock, and abrasion and corrosion resistance. The mean thermal conductivity for CVD-SiC is about 300 W/mK which is comparable to the best values that metals have exhibited (e.g., copper is 390 W/mK). Details of these data and variation of thermal conductivity with material thickness and growth direction will be presented. The electrical resistivity of CVD-SiC has been tailored in the range of 0.01-1000 ohm-cm by varying the CVD process conditions with minimal effect on the other properties of CVD-SiC. The high thermal conductivity of CVD-SiC along with its other attractive mechanical, thermal, physical and electrical properties makes it a preferred material for fabricating a variety of semiconductor furnace support components.
Keywords :
chemical vapour deposition; corrosion resistance; furnaces; oxidation; pyrolysis; rapid thermal processing; silicon compounds; thermal conductivity; thermal shock; wide band gap semiconductors; 0.01 to 1000 ohmcm; CVD manufacturing process; CVD-SiC; RTP chamber components; SiC; abrasion resistance; advanced thermal processing; corrosion resistance; electrical resistivity; furnace support components; growth direction; low-pressure CVD reactor; material thickness; mean thermal conductivity; oxidation; polycrystalline material; pyrolysis; thermal shock; Conducting materials; Electric resistance; Electric shock; Inductors; Manufacturing processes; Oxidation; Semiconductor materials; Silicon carbide; Thermal conductivity; Thermal resistance;
Conference_Titel :
Advanced Thermal Processing of Semiconductors 9th Internationa Conference on RTP 2001
Print_ISBN :
0-9638251-0-4
DOI :
10.1109/RTP.2001.1013769