Title :
Trends in MW-rated VSI technology and reliability for adjustable speed drives
Author :
Hosoda, Hiromi ; Al Mamun, Md ; Yoshino, Teruo
Author_Institution :
Drive Syst. Dept., Toshiba Mitsubishi-Electr. Ind. Syst. Corp. (TMEIC), Fuchu, Japan
Abstract :
In recent years, the drive equipment capacity has been developed to more than megawatt based on demands in various industries. High reliability is indispensable for such large scale equipment to make the total system reliability high. The paper reports trends of the voltage source inverter now applied to very large scale drive equipment. The paper also reports trends of the high capacity self-turn-off semiconductor devices and the inverter circuit configuration, which realize both large and reliable drive equipment. In the paper, reliability factors in manufacturing process of drive equipment are discussed and an example of field experiences is introduced.
Keywords :
VLSI; integrated circuit reliability; invertors; power integrated circuits; variable speed drives; MW-eated VSI technology; adjustable speed drives; drive equipment capacity; inverter circuit configuration; reliability; self-turn-off semiconductor devices; very large scale drive equipment; voltage source inverter; Assembly; Circuit faults; Large-scale systems; Milling machines; Power system reliability; Production facilities; Pulse width modulation inverters; Samarium; Steel; Variable speed drives;
Conference_Titel :
Applied Power Electronics Conference and Exposition (APEC), 2010 Twenty-Fifth Annual IEEE
Conference_Location :
Palm Springs, CA
Print_ISBN :
978-1-4244-4782-4
Electronic_ISBN :
1048-2334
DOI :
10.1109/APEC.2010.5433341
