Title :
Adaptive linear detection for DS-CDMA communications in impulsive channels
Author :
Mandayam, Narayan B.
Author_Institution :
Wireless Inf. Network Lab., Rutgers Univ., Piscataway, NJ, USA
Abstract :
There has been much work done on deriving adaptive linear detectors for DS-CDMA systems corrupted by additive Gaussian noise. However, such communication systems are often interfered with by noises other than the classical white Gaussian noise; the present author considers DS-CDMA systems corrupted by natural impulsive noise sources, such as those found in low-frequency atmospheric channels, and for channels corrupted by man-made impulsive sources such as those occurring in urban or military radio networks. He develops an adaptive linear detector, for such impulsive noise channels, which directly minimizes the average probability of bit-error, using an infinitesimal perturbation analysis (IPA) based stochastic gradient algorithm. The implementation allows a very simple recursive structure, and the conditions for convergence of this algorithm are presented. The performance of the detector is uniformly better than that of the linear correlator even under the extreme cases when either the multiple access interference or the impulsive noise is dominant
Keywords :
adaptive signal detection; code division multiple access; error statistics; land mobile radio; perturbation techniques; pseudonoise codes; radiofrequency interference; spread spectrum communication; stochastic processes; DS-CDMA communications; adaptive linear detection; bit-error probability; convergence; impulsive channels; infinitesimal perturbation analysis based stochastic gradient algorithm; low-frequency atmospheric channels; man-made impulsive sources; military radio networks; performance; recursive structure; urban radio networks; Additive noise; Algorithm design and analysis; Convergence; Detectors; Gaussian noise; Low-frequency noise; Military communication; Multiaccess communication; Radio network; Stochastic resonance;
Conference_Titel :
Vehicular Technology Conference, 1995 IEEE 45th
Conference_Location :
Chicago, IL
Print_ISBN :
0-7803-2742-X
DOI :
10.1109/VETEC.1995.504958