• DocumentCode
    1873815
  • Title

    Defect-Tolerant Gate Macro Mapping & Placement in Clock-Free Nanowire Crossbar Architecture

  • Author

    Bonam, Ravi ; Kim, Yong-Bin ; Choi, Minsu

  • Author_Institution
    Univ. of Missouri-Rolla, Rolla
  • fYear
    2007
  • fDate
    26-28 Sept. 2007
  • Firstpage
    161
  • Lastpage
    169
  • Abstract
    Recently, we proposed a new clock-free nanowire crossbar architecture based on a delay- insensitive paradigm called Null Convention Logic (NCL). The proposed architecture has simple periodic structure that is suitable for non-deterministic nanoscale assembly and does not require a clock distribution network - so it is intrinsically free from timing-related failure modes. Even though the proposed architecture offers improved manufacturability, it is still not free from defects. This paper elaborates on the different programming techniques to map a given threshold gate macro on a random PGMB (Programmable Gate Macro Block) with predefined dimension. Defect-Aware and Defect Unaware approaches have been considered to map a given threshold gate onto a PGMB without affecting its functionality. Defect aware approach uses a defect map, gate table which help in efficient programming and also conservative use of resources. Defect unaware approach on the other hand is faster than defect aware approach, does not use defect maps and is not as efficient as defect aware approach. Parametric simulation results using MATLAB are used to show the programmability of these approaches under various circumstances.
  • Keywords
    circuit layout; fault tolerance; logic circuits; nanowires; clock-free nanowire crossbar architecture; defect unaware approach; defect-aware approach; defect-tolerant gate macro mapping; defect-tolerant gate placement; nondeterministic nanoscale assembly; null convention logic; periodic structure; programming techniques; random programmable gate macro block; threshold gate macro; Circuits; Clocks; Computer architecture; Delay; Hysteresis; Logic; Manufacturing processes; Registers; Robustness; USA Councils;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Defect and Fault-Tolerance in VLSI Systems, 2007. DFT '07. 22nd IEEE International Symposium on
  • Conference_Location
    Rome
  • ISSN
    1550-5774
  • Print_ISBN
    978-0-7695-2885-4
  • Type

    conf

  • DOI
    10.1109/DFT.2007.62
  • Filename
    4358383