DocumentCode :
1873815
Title :
Defect-Tolerant Gate Macro Mapping & Placement in Clock-Free Nanowire Crossbar Architecture
Author :
Bonam, Ravi ; Kim, Yong-Bin ; Choi, Minsu
Author_Institution :
Univ. of Missouri-Rolla, Rolla
fYear :
2007
fDate :
26-28 Sept. 2007
Firstpage :
161
Lastpage :
169
Abstract :
Recently, we proposed a new clock-free nanowire crossbar architecture based on a delay- insensitive paradigm called Null Convention Logic (NCL). The proposed architecture has simple periodic structure that is suitable for non-deterministic nanoscale assembly and does not require a clock distribution network - so it is intrinsically free from timing-related failure modes. Even though the proposed architecture offers improved manufacturability, it is still not free from defects. This paper elaborates on the different programming techniques to map a given threshold gate macro on a random PGMB (Programmable Gate Macro Block) with predefined dimension. Defect-Aware and Defect Unaware approaches have been considered to map a given threshold gate onto a PGMB without affecting its functionality. Defect aware approach uses a defect map, gate table which help in efficient programming and also conservative use of resources. Defect unaware approach on the other hand is faster than defect aware approach, does not use defect maps and is not as efficient as defect aware approach. Parametric simulation results using MATLAB are used to show the programmability of these approaches under various circumstances.
Keywords :
circuit layout; fault tolerance; logic circuits; nanowires; clock-free nanowire crossbar architecture; defect unaware approach; defect-aware approach; defect-tolerant gate macro mapping; defect-tolerant gate placement; nondeterministic nanoscale assembly; null convention logic; periodic structure; programming techniques; random programmable gate macro block; threshold gate macro; Circuits; Clocks; Computer architecture; Delay; Hysteresis; Logic; Manufacturing processes; Registers; Robustness; USA Councils;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Defect and Fault-Tolerance in VLSI Systems, 2007. DFT '07. 22nd IEEE International Symposium on
Conference_Location :
Rome
ISSN :
1550-5774
Print_ISBN :
978-0-7695-2885-4
Type :
conf
DOI :
10.1109/DFT.2007.62
Filename :
4358383
Link To Document :
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