DocumentCode
1873875
Title
Regenerative AC Electronic Load with One-Cycle Control
Author
Jeong, In Wha ; Slepchenkov, Mikhail ; Smedley, Keyue ; Maddaleno, Franco
Author_Institution
Dept. of Electr. Eng. & Comput. Sci., Univ. of California, Irvine, Irvine, CA, USA
fYear
2010
fDate
21-25 Feb. 2010
Firstpage
1166
Lastpage
1171
Abstract
Variable linear or nonlinear loads are critical for testing AC power supplies and power equipment in various operating conditions. At present, most testing loads are based on bulky resistors, capacitors, and inductors on which the testing energy is consumed to generate excessive heat, and moreover, the impedance value is limited by finite combination of these bulky loads. Some commercial electronic loads are available, which provide flexible impedance control but the energy absorbed by the load is still dissipated as heat. The work presented in this paper is a continuous effort of UCI Power Electronics AC load project. A Regenerative AC Electronic Load (RACEL) is developed with One-Cycle Controller (OCC), which doesn´t require any Digital Signal Processor (DSP) and software in the control loop. Using a reconfigurable Field Programmable Analog Array (FPAA), the OCC can be integrated into a single FPAA with easy reconfiguration and simple interface structure. The proposed RACEL can emulate any impedance load, linear or nonlinear as well steady or dynamic with the regeneration of the testing energy. Simulation and experimental results are presented to verify the proposed RACEL performance.
Keywords
AC machines; digital signal processing chips; field programmable gate arrays; load (electric); RACEL performance; control loop; digital signal processor; one-cycle control; reconfigurable field programmable analog array; regenerative AC electronic load; Capacitors; Cogeneration; Electric variables control; Field programmable analog arrays; Impedance; Inductors; Power supplies; Resistors; Temperature control; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Applied Power Electronics Conference and Exposition (APEC), 2010 Twenty-Fifth Annual IEEE
Conference_Location
Palm Springs, CA
ISSN
1048-2334
Print_ISBN
978-1-4244-4782-4
Electronic_ISBN
1048-2334
Type
conf
DOI
10.1109/APEC.2010.5433354
Filename
5433354
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